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Camtek Ltd. (CAMT)

Nasdaq: CAMT · Optical Instruments & Lenses · filing with the SEC since 2000
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Grade6.0
◀ Past 6.9● Present 5.4▶ Future 5.9
1 est.
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Patents

US patents through Dec 31, 2025 · PatentsView, from the USPTO’s Open Data Portal · read Oct 27, 2026

70 patents granted to the 2 names below, as the owner printed on each patent when it was granted. A later sale, a lapse or an expiry is not read, so this is what was granted to Camtek Ltd.’s names, not what it holds today.

Patents granted
70
70 utility, 1976 to Dec 31, 2025
Granted in 2025
6
Against 2 in 2024 and 2 in 2023
Applications published
82
2 of them in 2025
Names they are printed under
2
its own name
By yearGrantedApplications published
'11'12'13'14'15'16'17'18'19'20'21'22'23'24'25
Each pair is one calendar year. Applications are published about eighteen months after filing, so the newest years read low.
What they are aboutgrants since 2021
Measurement8
Semiconductors3
Computer technology2
Optics1
The main technology area of each patent, in the World Intellectual Property Organization’s 35 fields.
Under which name2 counted
CAMTEK Ltd. its own name
IL, as the owner printed on each patent. 1 more under the same name are not counted (printed in US)
70 granted
54 published
CAMTEK LTD. its own name
named as the applicant on its applications, in IL
0 granted
28 published
Names not counted (2)
FRT GmbH
Most of its patents print KR; this name counts in DE. 1 granted and 1 published under it are not counted.
FRT GmbH
Most of its patents print KR; this name counts in DE. 0 granted and 1 published under it are not counted.
Newest grantseach row opens the USPTO’s own copy
GrantedPatentTitleFieldOwner as printed
Nov 18, 202512,474,162Bump measurement height metrologyMeasurementCAMTEK Ltd.
Nov 11, 202512,467,737Self-referencing interferometric microscopeMeasurementCAMTEK Ltd.
Jun 17, 202512,332,176Dark field illumination based on laser illuminated phosphorMeasurementCAMTEK Ltd.
Jun 3, 202512,320,757Semiconductor inspection tool system and method for wafer edge inspectionSemiconductorsCAMTEK Ltd.
May 27, 202512,315,206Inspection system for edge and bevel inspection of semiconductor structuresComputer technologyCAMTEK Ltd.
May 6, 202512,292,374Crystallographic defect inspectionMeasurementCAMTEK Ltd.
Jun 25, 202412,020,417Method and system for classifying defects in wafer using wafer-defect images, based on deep learningMeasurementCAMTEK Ltd.
Mar 12, 202411,927,545Semiconductor edge and bevel inspection tool systemMeasurementCAMTEK Ltd.
Nov 28, 202311,828,713Semiconductor inspection tool system and method for wafer edge inspectionSemiconductorsCAMTEK Ltd.
Jun 20, 202311,682,584Measuring buried layersSemiconductorsCAMTEK Ltd.
Newest applications publishedan application is a clue, never a plan
PublishedApplicationTitleFieldOwner as printed
Oct 2, 20252025/0305967Crystallographic Defect InspectionMeasurementCAMTEK Ltd.
Sep 18, 20252025/0290869SEMICONDUCTOR INSPECTION TOOL SYSTEM AND METHOD FOR WAFER EDGE INSPECTIONMeasurementCAMTEK LTD.
Oct 24, 20242024/0355083INSPECTION SYSTEM FOR EDGE AND BEVEL INSPECTION OF SEMICONDUCTOR STRUCTURESComputer technologyCAMTEK LTD. · patent 12,315,206 granted from it
Aug 29, 20242024/0289945METHOD AND SYSTEM FOR CLASSIFYING DEFECTS IN WAFER USING WAFER-DEFECT IMAGES, BASED ON DEEP LEARNINGMeasurementCAMTEK LTD.
Jan 4, 20242024/0003826SEMICONDUCTOR INSPECTION TOOL SYSTEM AND METHOD FOR WAFER EDGE INSPECTIONMeasurementCAMTEK LTD. · patent 12,320,757 granted from it
Sep 7, 20232023/0280282CONTINUOUS BUMP MEASUREMENT HEIGHT METROLOGYMeasurementCAMTEK Ltd.
Aug 10, 20232023/0251198DARK FIELD ILLUMINATION BASED ON LASER ILLUMINATED PHOSPHORMeasurementCAMTEK Ltd. · patent 12,332,176 granted from it
Jul 20, 20232023/0228559BUMP MEASUREMENT HEIGHT METROLOGYMeasurementCAMTEK Ltd. · patent 12,474,162 granted from it
Jul 7, 20222022/0214287AUTOMATIC DEFECT CLASSIFICATIONMeasurementCAMTEK Ltd.
Oct 28, 20212021/0334946METHOD AND SYSTEM FOR CLASSIFYING DEFECTS IN WAFER USING WAFER-DEFECT IMAGES, BASED ON DEEP LEARNINGMeasurementCAMTEK LTD. · patent 12,020,417 granted from it
What it applied for, 2024 to 2025: Measurement 4 · Computer technology 1.

A patent is counted where the owner printed on it when it was granted carries the company’s own name, a former name, the name of a subsidiary its annual report lists, or its own name with a patent-holding phrase (Technology Licensing, Intellectual Property and the like), once the legal form, case and punctuation are set aside, and prints a country that name counts in. PatentsView’s data are published under the Creative Commons Attribution 4.0 licence. Source: PatentsView's granted patents and pre-grant publications, disambiguated, from the USPTO's Open Data Portal, through Dec 31, 2025, read Oct 27, 2026.

SI Assistanton CAMT · research, not advice