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FormFactor, Inc. FormFactor, Inc. (FORM)

Nasdaq: FORM · Semiconductors & Related Devices · Livermore, CA · filing with the SEC since 2002
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Grade5.8
◀ Past 6.8● Present 6.3▶ Future 4.3
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Patents

US patents through Dec 31, 2025 · PatentsView, from the USPTO’s Open Data Portal · read Oct 27, 2026

508 patents granted to the 5 names below, as the owner printed on each patent when it was granted. A later sale, a lapse or an expiry is not read, so this is what was granted to FormFactor, Inc. FormFactor, Inc.’s names, not what it holds today.

Patents granted
508
507 utility, 1 reissue, 1976 to Dec 31, 2025
Granted in 2025
6
Against 5 in 2024 and 4 in 2023
Applications published
428
13 of them in 2025
Names they are printed under
5
its own name, a subsidiary
By yearGrantedApplications published
'11'12'13'14'15'16'17'18'19'20'21'22'23'24'25
Each pair is one calendar year. Applications are published about eighteen months after filing, so the newest years read low.
What they are aboutgrants since 2021
Measurement25
Semiconductors2
Optics1
Computer technology1
Telecommunications1
Handling1
The main technology area of each patent, in the World Intellectual Property Organization’s 35 fields.
Under which name5 counted
FormFactor, Inc. its own name
US, as the owner printed on each patent
507 granted
376 published
FormFactor, Inc. its own name
named as the applicant on its applications, in US
0 granted
45 published
FormFactor, Inc., a Delaware corporation its own name
US, as the owner printed on each patent
0 granted
4 published
High Precision Devices, Inc. a subsidiary
US, as the owner printed on each patent
1 granted
1 published
Keystone Photonics GmbH a subsidiary
named as the applicant on its applications, in DE
0 granted
2 published
Newest grantseach row opens the USPTO’s own copy
GrantedPatentTitleFieldOwner as printed
Oct 21, 202512,449,445Remote control devices for probe systems, probe systems that include the remote control devices, and methods of remotely operating a motorized positioner of a probe systemMeasurementFormFactor, Inc.
Oct 14, 202512,442,834Vertical probe array having sliding contacts in elastic guide plateMeasurementFormFactor, Inc.
Aug 5, 202512,379,395Probes, probe blades, tools for probe blades, blade holders, and probe systems for electrically testing a device under testMeasurementFormFactor, Inc.
Jun 24, 202512,337,467Wafer-handling end effectors configured to selectively lift a wafer from an upper surface of the wafer, probe systems that include the wafer-handling end effectors, and methods of utilizing the wafer-handling end effectorsHandlingFormFactor, Inc.
May 20, 202512,306,243Space transformers configured to be utilized in a probe system, probe systems that include the space transformers, and related methodsMeasurementFormFactor, Inc.
Jan 21, 202512,203,959Methods of establishing contact between a probe tip of a probe system and a device under test, probe systems that perform the methods, and storage media that directs probe systems to perform the methodsMeasurementFormFactor, Inc.
Oct 8, 202412,113,583Beamforming device testingTelecommunicationsFormFactor, Inc.
Jul 23, 202412,044,704Method of centering probe head in mounting frameMeasurementFormFactor, Inc.
Mar 12, 202411,927,621Cryogenic wafer testing systemSemiconductorsHigh Precision Devices, Inc.
Mar 12, 202411,927,603Probes that define retroreflectors, probe systems that include the probes, and methods of utilizing the probesMeasurementFormFactor, Inc.
Newest applications publishedan application is a clue, never a plan
PublishedApplicationTitleFieldOwner as printed
Dec 18, 20252025/0383373MEASUREMENT MODULE ADAPTERS, PROBE ASSEMBLIES THAT INCLUDE THE MEASUREMENT MODULE ADAPTERS, PROBE SYSTEMS THAT INCLUDE THE PROBE ASSEMBLIES, AND RELATED METHODSMeasurementFormFactor, Inc.
Dec 18, 20252025/0383371VIBRATION ISOLATION LAYERS, MEASUREMENT SYSTEMS THAT INCLUDE THE VIBRATION ISOLATION LAYERS, AND RELATED METHODSSemiconductorsFormFactor, Inc.
Dec 18, 20252025/0383231OPTICAL CALIBRATION STRUCTURES FOR OPTICAL PROBES, OPTICAL PROBE SYSTEMS THAT INCLUDE THE OPTICAL CALIBRATION STRUCTURES, AND METHODS OF CALIBRATING A PLURALITY OF OPTICAL PROBESMeasurementFormFactor, Inc.
Nov 20, 20252025/0353193WAFER-HANDLING END EFFECTORS CONFIGURED TO SELECTIVELY ENGAGE A WAFER VIA A PRESSURE FORCE AND TO SELECTIVELY GRIP THE WAFER VIA A VACUUM FORCE, WAFER-HANDLING UNITS THAT INCLUDE THE WAFER-HANDLING END EFFECTORS, SYSTEMS THAT INCLUDE THE WAFER-HANDLING UNITS, AND METHODS OF UTILIZING WAFER-HANDLING END EFFECTORSSemiconductorsFormFactor, Inc.
Nov 13, 20252025/0347586LENS ARRAYS, FIBER OPTIC FIXTURES THAT INCLUDE THE LENS ARRAYS, PROBE SYSTEMS THAT INCLUDE THE FIBER OPTIC FIXTURES, AND METHODS OF FORMING FIBER OPTIC FIXTURESOpticsFormFactor, Inc.
Oct 23, 20252025/0327836PROBES, PROBE BLADES, TOOLS FOR PROBE BLADES, BLADE HOLDERS, AND PROBE SYSTEMS FOR ELECTRICALLY TESTING A DEVICE UNDER TESTMeasurementFormFactor, Inc.
Oct 16, 20252025/0321266Probe head having features to facilitate cooling with liquid-cooled heat exchangerMeasurementFormFactor, Inc.
Sep 25, 20252025/0298079OPTICAL PROBE AND RELATED METHODSMeasurementKeystone Photonics GmbH
Sep 11, 20252025/0282063WAFER-HANDLING END EFFECTORS CONFIGURED TO SELECTIVELY LIFT A WAFER FROM AN UPPER SURFACE OF THE WAFER, PROBE SYSTEMS THAT INCLUDE THE WAFER-HANDLING END EFFECTORS, AND METHODS OF UTILIZING THE WAFER-HANDLING END EFFECTORSHandlingFormFactor, Inc.
Aug 14, 20252025/0258196Probe head having vertically embedded components in the printed circuit boardAudio-visual technologyFormFactor, Inc.
What it applied for, 2024 to 2025: Measurement 13 · Handling 2 · Semiconductors 2 · Telecommunications 1 · Audio-visual technology 1 · Optics 1.

A patent is counted where the owner printed on it when it was granted carries the company’s own name, a former name, the name of a subsidiary its annual report lists, or its own name with a patent-holding phrase (Technology Licensing, Intellectual Property and the like), once the legal form, case and punctuation are set aside, and prints a country that name counts in. PatentsView’s data are published under the Creative Commons Attribution 4.0 licence. Source: PatentsView's granted patents and pre-grant publications, disambiguated, from the USPTO's Open Data Portal, through Dec 31, 2025, read Oct 27, 2026.

SI Assistanton FORM · research, not advice