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Nova Ltd. (NVMI)

Nasdaq: NVMI · Optical Instruments & Lenses · Rehovot, IL · filing with the SEC since 2001
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Grade6.6
◀ Past 6.6● Present 6.0▶ Future 7.5
1 est.
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Patents

US patents through Dec 31, 2025 · PatentsView, from the USPTO’s Open Data Portal · read Oct 27, 2026

207 patents granted to the 5 names below, as the owner printed on each patent when it was granted. A later sale, a lapse or an expiry is not read, so this is what was granted to Nova Ltd.’s names, not what it holds today.

Patents granted
207
204 utility, 3 reissue, 1976 to Dec 31, 2025
Granted in 2025
12
Against 19 in 2024 and 8 in 2023
Applications published
202
15 of them in 2025
Names they are printed under
5
a former name, its own name, a subsidiary
By yearGrantedApplications published
'11'12'13'14'15'16'17'18'19'20'21'22'23'24'25
Each pair is one calendar year. Applications are published about eighteen months after filing, so the newest years read low.
What they are aboutgrants since 2021
Measurement39
Computer technology7
Optics6
Semiconductors4
Control1
The main technology area of each patent, in the World Intellectual Property Organization’s 35 fields.
Under which name5 counted
NOVA MEASURING INSTRUMENTS INC. a former name
IL, as the owner printed on each patent. 45 more under the same name are not counted (printed in US)
156 granted
77 published
NOVA LTD. its own name
IL, as the owner printed on each patent. 27 more under the same name are not counted (printed in JP, printed in US, printed in FR)
49 granted
44 published
NOVA MEASURING INSTRUMENTS LTD. a former name
named as the applicant on its applications, in IL. 33 more under the same name are not counted (printed in US)
0 granted
64 published
NOVA LTD. its own name
named as the applicant on its applications, in IL
0 granted
15 published
SENTRONICS METROLOGY GMBH a subsidiary
DE, as the owner printed on each patent
2 granted
2 published
Newest grantseach row opens the USPTO’s own copy
GrantedPatentTitleFieldOwner as printed
Dec 16, 202512,498,332Imaging metrologyMeasurementNOVA LTD.
Nov 11, 202512,467,879Optical phase measurement method and systemMeasurementNOVA LTD.
Nov 11, 202512,467,869Raman spectroscopy based measurement systemMeasurementNOVA LTD.
Aug 19, 202512,392,733Combined ocd and photoreflectance method and systemMeasurementNOVA LTD.
Jul 29, 202512,372,473Accurate Raman spectroscopyMeasurementNOVA LTD.
Jul 15, 202512,360,462Optical metrology system and methodMeasurementNOVA LTD.
Jul 15, 202512,359,968Systems and methods for optical metrologyMeasurementNOVA LTD.
Jun 3, 202512,321,102Machine and deep learning methods for spectra-based metrology and process controlOpticsNOVA LTD.
May 13, 202512,298,182Optical technique for material characterizationMeasurementNOVA LTD.
Feb 25, 202512,236,364Metrology and process control for semiconductor manufacturingComputer technologyNOVA LTD.
Newest applications publishedan application is a clue, never a plan
PublishedApplicationTitleFieldOwner as printed
Dec 25, 20252025/0390028SYSTEMS AND METHODS FOR OPTICAL MEASURING OF PROPERTIES OF SAMPLES USING POLARIZED OPTICAL BEAMSOpticsNOVA LTD.
Dec 25, 20252025/0389665HYBRID METROLOGY METHOD AND SYSTEMMeasurementNOVA LTD.
Dec 25, 20252025/0389530OPTICAL CRITICAL DIMENSIONS (OCD) METROLOGY FOR THICK STACKSMeasurementNOVA LTD.
Oct 30, 20252025/0334887MACHINE AND DEEP LEARNING METHODS FOR SPECTRA-BASED METROLOGY AND PROCESS CONTROLOpticsNOVA LTD.
Jun 26, 20252025/0207909COMBINED PHOTOTHERMAL AND OCD FOR SEMI-OPAQUE STRUCTURESOpticsNOVA LTD.
Jun 19, 20252025/0198840HIGH FREQUENCY MODULATION CHOPPERMeasurementNOVA LTD.
Jun 5, 20252025/0181941METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURINGComputer technologyNOVA LTD.
Apr 24, 20252025/0130172ACCURATE RAMAN SPECTROSCOPYMeasurementNOVA LTD.
Apr 17, 20252025/0123571FULL-WAFER METROLOGY UP-SAMPLINGOpticsNOVA LTD.
Apr 17, 20252025/0123210RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURESMeasurementNOVA LTD.
What it applied for, 2024 to 2025: Measurement 21 · Optics 6 · Computer technology 3.

A patent is counted where the owner printed on it when it was granted carries the company’s own name, a former name, the name of a subsidiary its annual report lists, or its own name with a patent-holding phrase (Technology Licensing, Intellectual Property and the like), once the legal form, case and punctuation are set aside, and prints a country that name counts in. PatentsView’s data are published under the Creative Commons Attribution 4.0 licence. Source: PatentsView's granted patents and pre-grant publications, disambiguated, from the USPTO's Open Data Portal, through Dec 31, 2025, read Oct 27, 2026.

SI Assistanton NVMI · research, not advice