Patents
US patents through Dec 31, 2025 · PatentsView, from the USPTO’s Open Data Portal · read Oct 27, 2026
203 patents granted to the 3 names below, as the owner printed on each patent when it was granted. A later sale, a lapse or an expiry is not read, so this is what was granted to PDF Solutions, Inc.’s names, not what it holds today.
Patents granted
203
203 utility, 1976 to Dec 31, 2025
Granted in 2025
5
Against 5 in 2024 and 8 in 2023
Applications published
51
2 of them in 2025
Names they are printed under
3
its own name, a subsidiary
By yearGrantedApplications published
'11'12'13'14'15'16'17'18'19'20'21'22'23'24'25
Each pair is one calendar year. Applications are published about eighteen months after filing, so the newest years read low.
What they are aboutgrants since 2021
Computer technology12
Semiconductors9
Measurement5
Electrical machinery, apparatus, energy4
Audio-visual technology1
Control1
The main technology area of each patent, in the World Intellectual Property Organization’s 35 fields.
Under which name3 counted
PDF SOLUTIONS, INC. its own name
US, as the owner printed on each patent
34 publishedPDF Solutions, Inc. its own name
named as the applicant on its applications, in US
17 publishedCimetrix Incorporated a subsidiary
US, as the owner printed on each patent
0 publishedNames not counted (1)
PDF SOLUTIONS INC
Most of its patents print FR; this name counts in US. 1 granted and 1 published under it are not counted.
Newest grantseach row opens the USPTO’s own copy
| Granted | Patent | Title | Field | Owner as printed |
|---|
| Sep 30, 2025 | 12,431,333 | Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell | Electrical machinery, apparatus, energy | PDF SOLUTIONS, INC. |
| Sep 30, 2025 | 12,429,520 | Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block | Measurement | PDF SOLUTIONS, INC. |
| Sep 16, 2025 | 12,416,663 | Embedded system to characterize BTI degradation effects in MOSFETs | Measurement | PDF SOLUTIONS, INC. |
| Feb 18, 2025 | 12,229,945 | Wafer bin map based root cause analysis | Computer technology | PDF SOLUTIONS, INC. |
| Feb 11, 2025 | 12,223,012 | Machine learning variable selection and root cause discovery by cumulative prediction | Computer technology | PDF SOLUTIONS, INC. |
| Jul 16, 2024 | 12,038,802 | Collaborative learning model for semiconductor applications | Computer technology | PDF SOLUTIONS, INC. |
| Jul 16, 2024 | 12,038,476 | Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block | Measurement | PDF SOLUTIONS, INC. |
| Jun 25, 2024 | 12,020,897 | Systems, devices, and methods for aligning a particle beam and performing a non-contact electrical measurement on a cell and/or non-contact electrical measurement cell vehicle using a registration cell | Electrical machinery, apparatus, energy | PDF SOLUTIONS, INC. |
| Apr 30, 2024 | 11,972,987 | Die level product modeling without die level input data | Semiconductors | PDF SOLUTIONS, INC. |
| Apr 30, 2024 | 11,972,552 | Abnormal wafer image classification | Computer technology | PDF SOLUTIONS, INC. |
Newest applications publishedan application is a clue, never a plan
| Published | Application | Title | Field | Owner as printed |
|---|
| May 1, 2025 | 2025/0138505 | Sequenced Approach for Determining Wafer Path Quality | Control | PDF SOLUTIONS, INC. |
| Mar 13, 2025 | 2025/0085234 | USE OF LAYOUT ANALYSIS TO ENABLE EFFICIENT AND EFFECTIVE RANDOM DEFECT INSPECTION USING A VECTOR-MODE E-BEAM INSPECTION MACHINE | Semiconductors | PDF Solutions, Inc. |
| Oct 31, 2024 | 2024/0362106 | Predicting Equipment Fail Mode from Process Trace | Computer technology | PDF SOLUTIONS, INC. |
| Oct 3, 2024 | 2024/0329128 | SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRICAL MEASUREMENT ON A CELL, NON-CONTACT ELECTRICAL MEASUREMENT CELL VEHICLE, CHIP, WAFER, DIE, OR LOGIC BLOCK | Measurement | PDF Solutions, Inc. · patent 12,429,520 granted from it |
| Sep 12, 2024 | 2024/0304414 | SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERFORMING A NON-CONTACT ELECTRICAL MEASUREMENT ON A CELL AND/OR NON-CONTACT ELECTRICAL MEASUREMENT CELL VEHICLE USING A REGISTRATION CELL | Electrical machinery, apparatus, energy | PDF Solutions, Inc. · patent 12,431,333 granted from it |
| Jun 6, 2024 | 2024/0184283 | Time-Series Segmentation and Anomaly Detection | Control | PDF SOLUTIONS, INC. |
| Apr 18, 2024 | 2024/0127420 | Evaluating a Surface Microstructure | Electrical machinery, apparatus, energy | PDF SOLUTIONS, INC. |
| Nov 23, 2023 | 2023/0377132 | Wafer Bin Map Based Root Cause Analysis | Computer technology | PDF SOLUTIONS, INC. · patent 12,229,945 granted from it |
| Nov 9, 2023 | 2023/0358804 | SYSTEMS, DEVICES, AND METHODS FOR PERFORMING A NON-CONTACT ELECTRICAL MEASUREMENT ON A CELL, NON-CONTACT ELECTRICAL MEASUREMENT CELL VEHICLE, CHIP, WAFER, DIE, OR LOGIC BLOCK | Measurement | PDF Solutions, Inc. · patent 12,038,476 granted from it |
| Sep 7, 2023 | 2023/0282444 | SYSTEMS, DEVICES, AND METHODS FOR ALIGNING A PARTICLE BEAM AND PERFORMING A NON-CONTACT ELECTRICAL MEASUREMENT ON A CELL AND/OR NON-CONTACT ELECTRICAL MEASUREMENT CELL VEHICLE USING A REGISTRATION CELL | Electrical machinery, apparatus, energy | PDF Solutions, Inc. · patent 12,020,897 granted from it |
What it applied for, 2024 to 2025: Electrical machinery, apparatus, energy 2 · Control 2 · Measurement 1 · Computer technology 1 · Semiconductors 1.
A patent is counted where the owner printed on it when it was granted carries the company’s own name, a former name, the name of a subsidiary its annual report lists, or its own name with a patent-holding phrase (Technology Licensing, Intellectual Property and the like), once the legal form, case and punctuation are set aside, and prints a country that name counts in. PatentsView’s data are published under the Creative Commons Attribution 4.0 licence. Source: PatentsView's granted patents and pre-grant publications, disambiguated, from the USPTO's Open Data Portal, through Dec 31, 2025, read Oct 27, 2026.